Systems and methods to detect a scratch
AssigneeCloud Software Group, Inc.
InventorDavid Warren Katz
Life of this patent
Estimating the term…
Abstract
Systems and methods to detect a scratch are provided. The method includes identifying, via an OPTICS technique, a cluster of points on an image. The method also includes utilizing a principal curves technique to identify a curve that approximates one or more points of the cluster of points as a smooth curve. The method further includes determining one or more characteristics of the curve. The method further includes determining one or more characteristics of the cluster. The method further includes identifying a scratch based on at least one of the one or more characteristics of the curve and the one or more characteristics of the cluster.
Claims12
A computer-implemented method to detect a scratch, comprising:
- identifying, via an Ordering Points To Identify The Clustering Structure (OPTICS) technique, a cluster of points of an image represented by a digital image file;
- utilizing a principal curves technique to identify a curve that approximates one or more points of the cluster of points as a smooth curve;
- determining one or more characteristics of the curve by:
- determining a length of the curve;
- determining a curvature of the curve;
- determining a width of the curve;
- determining a ratio of the length of the curve to a width of the cluster, wherein one of the one or more characteristics of the cluster is the ratio of the length of the curve to the width of the cluster;
- determining a ratio of a length of the curve to a width of the cluster;
- determining a position of the curve relative to the cluster by calculating a distance between the curve and at least one point within the cluster;
- determining one or more characteristics of the cluster;
- identifying a scratch based on at least one of the one or more characteristics of the curve and the one or more characteristics of the cluster;
- and
- identifying one or more of a length, a width, and a curvature of the scratch based on one or more of the length, the curvature, and the position of the curve relative to the cluster.
A scratch detection system, comprising:
- a storage medium;
- and
- one or more processors configured to:
- identify, via an Ordering Points To Identify The Clustering Structure (OPTICS) technique, a cluster of points on an image;
- utilize a principal curves technique to identify a curve that approximates one or more points of the cluster of points as a smooth curve;
- determine one or more characteristics of the curve by:
- determining a length of the curve;
- determining a curvature of the curve;
- determining a width of the curve;
- determining a ratio of the length of the curve to a width of the cluster, wherein one of the one or more characteristics of the cluster is the ratio of the length of the curve to the width of the cluster;
- determining a ratio of a length of the curve to a width of the cluster;
- determining a position of the curve relative to the cluster by calculating a distance between the curve and at least one point within the cluster;
- determine one or more characteristics of the cluster;
- identify a scratch based on at least one of the one or more characteristics of the curve and the one or more characteristics of the cluster;
- and
- identify one or more of a length, a width, and a curvature of the scratch based on one or more of the length, the curvature, and the position of the curve relative to the cluster.
A non-transitory computer-readable medium comprising instructions, which when executed by a processor, causes the processor to perform operations comprising:
- identifying, via an Ordering Points To Identify The Clustering Structure (OPTICS) technique, a cluster of points on an image;
- utilizing a principal curves technique to identify a curve that approximates one or more points of the cluster of points as a smooth curve;
- determining one or more characteristics of the curve by:
- determining a length of the curve;
- determining a curvature of the curve;
- determining a width of the curve;
- determining a ratio of the length of the curve to a width of the cluster, wherein one of the one or more characteristics of the cluster is the ratio of the length of the curve to the width of the cluster;
- determining a ratio of a length of the curve to a width of the cluster;
- determining a position of the curve relative to the cluster by calculating a distance between the curve and at least one point within the cluster;
- determining one or more characteristics of the cluster;
- identifying a scratch based on at least one of the one or more characteristics of the curve and the one or more characteristics of the cluster;
- and
- identifying one or more of a length, a width, and a curvature of the scratch based on one or more of the length, the curvature, and the position of the curve relative to the cluster.
Dependencies are inferred from the claim text.