Thermal management of storage devices

An apparatus with a memory and processor, the apparatus configured to:

• collect Self-Monitoring, Analysis, and Reporting (SMART) data from one or more non-volatile storage devices via one or more sensors of the one or more non-volatile storage devices, wherein the SMART data comprises one or more of power-on hours, media errors, maximum temperature, total bytes read and written, and temperature predictions;
• use a component analyzer to reduce a dimensionality of the collected SMART data using one or more principal component analysis (PCA) techniques to generate reduced-dimensionality SMART data used to identify critical features influencing storage device temperature;
• use a clustering engine to perform k-means clustering on the reduced-dimensionality SMART data to identify groups of the one or more non-volatile storage devices with similar thermal characteristics;
• predict, based on the clustering, when a temperature corresponding to one or more portions of the one or more non-volatile storage devices will reach a thermal threshold;
• control mapping of logical tracks to physical tracks of the one or more non-volatile storage devices based on the reduced-dimensionality SMART data and the prediction;
• and
• direct data to be written to the one or more non-volatile storage devices to the physical tracks of the one or more non-volatile storage devices based on the mapping of the logical tracks of the one or more non-volatile storage devices to the physical tracks of the one or more non-volatile storage devices and based on the prediction to proactively prevent thermal throttling;
• grouping the one or more non-volatile storage devices into hypers, wherein each hyper includes a collection of tracks on a non-volatile storage device of the one or more non-volatile storage devices, and wherein the grouping is based on similar thermal and activity characteristics including one or more of:
• power-on hours, media errors, maximum temperature, total bytes read and written, and temperature predictions after prevent thermal throttling.