Abnormality determination apparatus, abnormality determination model generation method, and abnormality determination method
AssigneeJfe Steel Corporation
InventorsTakehide Hirata, Kei Shomura
Life of this patent
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AssigneeJfe Steel Corporation
InventorsTakehide Hirata, Kei Shomura
Estimating the term…
An abnormality determination apparatus: performs, during normal operation of the facility, K times of clipping from time-series signals indicating an operation state of the facility; sets M types as types of the time-series signals clipped by the time-series signal clipping unit, constructs an M-dimensional vector, and registers the constructed vector as a normal vector; sets an abnormality determination flag as a first type when a maximum value of correlation between variables is less than a predetermined value, sets an abnormality determination flag as a second type when the maximum value is the predetermined value or more, and performs, when the flag is of the second type, a principal component analysis on a registered normal vector group to calculate a transform coefficient of a principal component and registers each of the calculated transform coefficients as an abnormality determination model; and determines an abnormality of the facility.
An abnormality determination apparatus for determining an abnormality of a facility performing a predetermined operation, the abnormality determination apparatus comprising:
An abnormality determination method of generating a model and determining an abnormality of a facility for performing a predetermined operation, the abnormality determination method comprising:
An abnormality determination apparatus for determining an abnormality of a facility performing a predetermined operation, the abnormality determination apparatus comprising:
Dependencies are inferred from the claim text.