Probe unit and charge/discharge inspection device

A probe unit for a charge/discharge inspection device, the probe unit comprising:

• a plurality of first probe holding plates on which one or more positive-electrode probes are arranged in order;
• a plurality of second probe holding plates that are opposite to the plurality of respective first probe holding plates and on which one or more negative-electrode probes are arranged in order;
• and
• a movable support part that is provided between the plurality of first probe holding plates and the plurality of second probe holding plates so as to extend in a direction in which the positive-electrode probes or the negative-electrode probes are arranged, wherein
• the probe unit comprises:
• a first moving mechanism that, in a state where the plurality of first probe holding plates or/and the plurality of second probe holding plates are attached so as to be movable in a direction toward each other and a direction away from each other, moves the plurality of first probe holding plates or/and the plurality of second probe holding plates in the direction toward each other and the direction away from each other;
• and
• a second moving mechanism that moves the plurality of first probe holding plates in a direction toward each other and a direction away from each other and moves the plurality of second probe holding plates in a direction toward each other and a direction away from each other,
• in the first moving mechanism, the support part is linked to the plurality of first probe holding plates and the support part is linked to the plurality of second probe holding plates via a frame, and by moving the support part, a connection portion between the frame and the plurality of first probe holding plates or/and a connection portion between the frame and the plurality of second probe holding plates are moved in a direction connecting the first probe holding plates and the second probe holding plates, and
• in the second moving mechanism, a frame that links each of the plurality of first probe holding plates and each of the plurality of second probe holding plates corresponding to the first probe holding plate moves in a direction in which the support part extends to move the plurality of first probe holding plates and the plurality of second probe holding plates in a direction in which the plurality of positive-electrode probes or the plurality of negative-electrode probes are arranged.