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US 12,754,168 B2Granted
C-scan data merging
AssigneeEvident Canada, Inc.
InventorRémi Leclerc
Life of this patent
Estimating the term…
Abstract
Examples of the present subject matter provide techniques for gathering inspection data (e.g., c-scan) from a plurality of probes, such as ECA probes. Each probe may generate inspection data obtained from different in-plane probe orientations on a surface, such as providing indications from disturbances or flaws located in different in-plane directions relative to a probe sensitivity axis. The inspection data may then be combined while indications at different orientations may be preserved and then merged to generate a composite. Pattern recognition using templates defining flaws or abnormalities may then be performed to determine the type of indication, e.g., detrimental flaw or non-detrimental abnormality.
Claims12
A method comprising:
- scanning, by a first eddy-current array probe, an object along a scan axis to generate a first set of c-scan inspection data representing first eddy-current responses, the first eddy-current array probe comprising a first probe sensitivity axis at a first orientation relative to the scan axis, the first set of c-scan inspection data comprising first disturbance indication data corresponding to deviations in the first eddy-current responses at an associated spatial location;
- scanning, by a second eddy-current array probe, the object along the scan axis to generate a second set of c-scan inspection data representing second eddy-current responses, the second eddy-current array probe comprising a second probe sensitivity axis at a second orientation relative to the scan axis, the second set of c-scan inspection data comprising second disturbance indication data corresponding to deviations in the second eddy-current responses at an associated spatial location, the second orientation being different from the first orientation;
- combining the first and second sets of c-scan inspection data and classifying an orientation of each of the first and second disturbance indication data to generate a combined c-scan data set;
- based on the spatial locations associated with the classified first and second disturbance indication data satisfying a proximity threshold, merging the first and second disturbance indication data of the combined c-scan data to generate a composite image representing an object abnormality.
1 more element
An inspection system comprising:
- a first eddy-current array probe configured to obtain a first set of c-scan inspection data from an object by scanning along a scan axis, the first set of c-scan inspection data representing first eddy-current responses, the first eddy-current array probe comprising a first probe sensitivity axis configured to be at a first orientation relative to the scan axis, the first set of c-scan inspection data comprising first disturbance indication data corresponding to deviations in the first eddy-current responses at an associated spatial location;
- a second eddy-current array probe configured to obtain a second set of c-scan inspection data from the object by scanning along the scan axis, the second eddy-current array probe comprising a second probe sensitivity axis at a second orientation relative to the scan axis, the second set of c-scan inspection data comprising second disturbance indication data corresponding to deviations in the second eddy-current responses at an associated spatial location, the second orientation being different from the first orientation;
- and
- a processor configured to:
- combine the first and second sets of c-scan inspection data and classify an orientation of each of the first and second disturbance indication data to generate a combined data c-scan;
- and
- based on the spatial locations associated with the classified first and second disturbance indication data, merge the first and second disturbance indication data of the combined c-scan data to generate a composite image representing an object abnormality.
4 more elements
A non-transitory machine readable medium embodying instructions that, when executed by a machine, cause the machine to perform operations comprising:
- receiving, from a first eddy-current array probe, a first set of c-scan inspection data representing first eddy-current responses, wherein the first set of c-scan inspection data is generated by the first eddy-current array probe by scanning an object along a scan axis, the first eddy-current array probe comprising a first probe sensitivity axis at a first orientation relative to the scan axis, the first set of c-scan inspection data comprising first disturbance indication data corresponding to deviations in the first eddy-current responses at an associated spatial location;
- receiving, from a second eddy-current array probe, a second set of c-scan inspection data representing second eddy-current responses, wherein the second set of c-scan inspection data is generated by the second eddy-current array probe by scanning the object along the scan axis, the second eddy-current array probe comprising a second probe sensitivity axis at a second orientation relative to the scan axis, the second set of c-scan inspection data comprising second disturbance indication data corresponding to deviations in the second eddy-current responses at an associated spatial location, the second orientation being different from the first orientation;
- combining the first and second sets of c-scan inspection data and classifying an orientation of each of the first and second disturbance indication data to generate a combined c-scan data set;
- based on the spatial locations associated with the classified first and second disturbance indication data satisfying a proximity threshold, merging the first and second disturbance indication data of the combined c-scan data to generate a composite image representing an object abnormality.
1 more element
Dependencies are inferred from the claim text.