Thickness correction for video extensometer systems and methods

A system for correcting for a variable thickness of a test specimen, the system comprising:

• a testing system to secure a test specimen, the testing system comprising an imaging device configured to capture one or more images of the test specimen, wherein:
• the test specimen comprises a first surface and a second surface opposite the first surface, the first and second surfaces being generally perpendicular to a centerline extending from the imaging device, and
• in each of the one or more images, the first surface is facing the imaging device;
• and
• a processing system configured to:
• receive a thickness of a test specimen, the thickness corresponding to a distance between the first surface of the test specimen and the second surface of the test specimen;
• determining, via a processing system, a position of a measurement plane based on the received thickness of the test specimen, the measurement plane corresponding to the first surface of the test specimen;
• calculate a correction factor based in part on a calibration distance defined by a calibration plane associated with the testing system, and based in part on a correction distance between the measurement plane and the calibration plane;
• receive the one or more images of the test specimen, wherein each of the one or more images is associated with one or more measurements of the test specimen;
• and
• generate one or more corrected characteristics by applying the correction factor to at least one of the one or more measurements of the test specimen.

A processing system for correcting for a variable thickness of a test specimen in one or more images of the test specimen captured by an imaging device of a testing system, the processing system configured to:

• receive a thickness of a test specimen, the thickness corresponding to a distance between a first surface of the test specimen and a second surface of the test specimen opposite the first surface, the first and second surfaces being generally perpendicular to a centerline extending from the imaging device;
• determine a position of a measurement plane based on the received thickness of the test specimen, the measurement plane corresponding to the first surface of the test specimen;
• calculate a correction factor based in part on a calibration distance defined by a calibration plane associated with the testing system, and in part on a correction distance between the measurement plane and the calibration plane;
• receive the one or more images of the test specimen, wherein:
• in each of the one or more images, the first surface is facing the imaging device, and each of the one or more images is associated with one or more measurements of the test specimen;
• and
• generate one or more corrected characteristics by applying a correction factor to at least one of the one or more measurements of the test specimen.