Method and arrangement for an X-ray source
AssigneeExcillum AB
InventorsPer Takman, Tomi Tuohimaa, Ulf Lundström
Life of this patent
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AssigneeExcillum AB
InventorsPer Takman, Tomi Tuohimaa, Ulf Lundström
Estimating the term…
There is provided an X-ray source comprising an electron source for providing an electron beam, the electron source comprising a cathode, a Wehnelt, and an anode; an electron optic arrangement configured to deflect and focus the electron beam towards a target for generation of X-ray radiation; an arrangement for determining a quantity indicative of a width of the electron beam; and a controller configured to compute a quantity dependent on a divergence of the electron beam at an entrance of the electron optic arrangement based on the quantity indicative of a width of the electron beam; and apply a bias voltage to the Wehnelt such that the quantity dependent on the divergence of the electron beam at the entrance of the electron optic arrangement is adjusted towards a desired value. A corresponding method is also provided.
An X-ray source comprising:
A method at an X-ray source comprising an electron source for providing an electron beam and an electron optic arrangement for deflecting and focusing the electron beam towards a target for generation of X-ray radiation, the electron source comprising a cathode, a Wehnelt, and an anode, the method comprising:
Dependencies are inferred from the claim text.