Film bulk acoustic resonator
AssigneeAAC Technologies (Nanjing) Co., Ltd.
InventorsZhang Zhang, Shuai Yang, Ke Wu, Zhiqiang Zhuang, Lirong Zhang, Chao Wang
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AssigneeAAC Technologies (Nanjing) Co., Ltd.
InventorsZhang Zhang, Shuai Yang, Ke Wu, Zhiqiang Zhuang, Lirong Zhang, Chao Wang
Estimating the term…
The present invention provides a FBAR, which includes a substrate, an acoustic reflector, a first electrode, a piezoelectric layer, a second electrode, and an etch-stop layer. The acoustic reflector is arranged on the substrate, the first electrode is arranged on a side of the substrate and covers the acoustic reflector, and at least a part of the piezoelectric layer is arranged on a side of the first electrode away from the substrate. The second electrode is arranged on a side of the piezoelectric layer away from the first electrode, and the etch-stop layer is arranged on a side of the second electrode away from the piezoelectric layer. The FBAR further includes at least two stacked components. At least an edge of each of the at least two stacked components is misaligned. The quality factor of the FBAR in the present invention is relatively high.
A film bulk acoustic resonator (FBAR), comprising a substrate, an acoustic reflector, a first electrode, a piezoelectric layer, a second electrode, and an etch-stop layer, wherein the acoustic reflector is arranged on the substrate, the first electrode is arranged on a side of the substrate and covers the acoustic reflector, and at least a part of the piezoelectric layer is arranged on a side of the first electrode away from the substrate;
Dependencies are inferred from the claim text.