Plasma processing apparatus
AssigneeTokyo Electron Limited
InventorYohei Yamazawa
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AssigneeTokyo Electron Limited
InventorYohei Yamazawa
Estimating the term…
A plasma processing apparatus is provided. The apparatus comprises: a chamber accommodating a substrate; a window member forming an upper portion of the chamber; a gas inlet port disposed in at least one of a sidewall of the chamber and the window member, and configured to supply a gas into the chamber; and an antenna disposed above the chamber with the window member interposed therebetween, having a linear shape and made of a conductive material, and configured to produce plasma from the gas supplied into the chamber by radiating a radio frequency (RF) power into the chamber. The antenna includes: a first coil to which the RF power is supplied; and a plurality of second coils formed in the same shape and arranged around the first coil to be rotationally symmetrical with respect to a central axis of the first coil. One ends of the second coils are connected one-to-one to variable capacitors.
A plasma processing apparatus comprising:
Dependencies are inferred from the claim text.