Multipole elements and charged particle microscope systems including the same
AssigneeFEI Company
InventorsAlexander Henstra, Galen Gledhill, Ali Gheidari
Life of this patent
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AssigneeFEI Company
InventorsAlexander Henstra, Galen Gledhill, Ali Gheidari
Estimating the term…
Multipole elements and charged particle microscope systems including the same. In an example, an apparatus can include plurality of electrodes including a first shape subset and a second shape subset. Each electrode of the first shape subset includes an electrode active surface with a shape that is different than that of each electrode of the second shape subset. In another example, an apparatus can include a plurality of electrodes including a first side subset and a second side subset. Each electrode includes an electrode extension extending along a first lateral direction or a second lateral direction. In another example, an apparatus can include an optical column with a plurality of multipole elements that are fully contained within a first angular envelope that subtends a first angle that is at most 50 degrees while the working distance is at most 10 mm.
An apparatus comprising:
Dependencies are inferred from the claim text.