Charged particle gun and charged particle beam apparatus
AssigneeHitachi High-Tech Corporation
InventorsTomoya Igari, Masahiro Fukuta, Takashi Doi
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AssigneeHitachi High-Tech Corporation
InventorsTomoya Igari, Masahiro Fukuta, Takashi Doi
Estimating the term…
Provided are a charged particle gun and a charged particle beam apparatus that can reduce instability in the amount of emitted charged particles and deviation in the charged particle trajectory when the amount of charged particle beams is increased. A charged particle gun includes a charged particle source that generates a charged particle, an electrode portion that includes an extraction electrode for extracting a charged particle beam from the charged particle source, a voltage introduction unit that introduces voltage to the electrode portion, and a temperature adjustment unit that adjusts a temperature of the electrode portion. The temperature adjustment unit is configured to adjust the temperature of the electrode portion based on a change in a state of the electrode portion.
A charged particle gun comprising:
A charged particle gun comprising:
A charged particle gun comprising:
A charged particle gun comprising:
Dependencies are inferred from the claim text.