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US 12,749,598 B2Granted
Superconducting wire and superconducting wire connection structure
AssigneeSumitomo Electric Industries, Ltd.
InventorTakashi Yamaguchi
Life of this patent
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Abstract
A superconducting wire includes a substrate and a superconducting layer disposed on the substrate. The superconducting layer has a first surface facing the substrate and a second surface opposite to the first surface. The second surface has a portion having an arithmetic average roughness of 20 nm or more and a maximum height of 0.25 μm or more.
Claims8
A superconducting wire comprising:
- a substrate;
- and
- a superconducting layer disposed on the substrate, wherein
- the superconducting layer has a first surface facing the substrate and a second surface opposite to the first surface,
- the second surface has a portion having an arithmetic average roughness of 20 nm or more and a maximum height of 0.25 μm or more, and
- the maximum height of the portion of the second surface is measured by:
- (a) obtaining a first cross-sectional curve and a second cross-sectional curve from a measurement region included in the portion of the second surface, each of the first cross-sectional curve and the second cross-sectional curve having a sampling length;
- (b) obtaining a first maximum height, the first maximum height being a sum of the largest peak height and the largest valley depth obtained from the first cross-sectional curve within the sampling length;
- (c) obtaining a second maximum height, the second maximum height being a sum of the largest peak height and the largest valley depth obtained from the second cross-sectional curve within the sampling length, and
- (d) averaging the first maximum height and the second maximum height.
7 more elements
A superconducting wire connection structure comprising:
- a first superconducting wire;
- a second superconducting wire;
- and
- a connection layer, wherein
- the first superconducting wire includes a first substrate, a first superconducting layer disposed on the first substrate, a first protective layer disposed on the first superconducting layer, and a first stabilization layer disposed on the first protective layer,
- the second superconducting wire includes a second substrate, a second superconducting layer disposed on the second substrate, a second protective layer disposed on the second superconducting layer, and a second stabilization layer disposed on the second protective layer,
- the first superconducting layer has a first surface facing the first substrate and a second surface opposite to the first surface,
- the second superconducting layer has a third surface facing the second substrate and a fourth surface opposite to the third surface,
- the first stabilization layer is connected to the second stabilization layer by the connection layer,
- the second surface has a portion having an arithmetic average roughness of 20 nm or more and a maximum height of 0.25 μm or more,
- the fourth surface has a portion having an arithmetic average roughness of 20 nm or more and a maximum height of 0.25 μm or more, and
- the maximum height of the portion of the second surface is measured by:
- (a) obtaining a first cross-sectional curve and a second cross-sectional curve from a measurement region included in the portion of the second surface, each of the first cross-sectional curve and the second cross-sectional curve having a sampling length;
- (b) obtaining a first maximum height of the portion of the second surface, the first maximum height of the portion of the second surface being a sum of a largest peak height and a largest valley depth obtained within the sampling length from the first cross-sectional curve from the measurement region included in the portion of the second surface;
- (c) obtaining a second maximum height of the portion of the second surface, the second maximum height of the portion of the second surface being a sum of a largest peak height and a largest valley depth obtained within the sampling length from the second cross-sectional curve from the measurement region included in the portion of the second surface, and
- (d) averaging the first maximum height of the portion of the second surface and the second maximum height of the portion of the second surface, and
- the maximum height of the portion of the fourth surface is measured by:
- (a) obtaining a first cross-sectional curve and a second cross-sectional curve from a measurement region included in the portion of the fourth surface, each of the first cross-sectional curve and the second cross-sectional curve having a sampling length;
- (b) obtaining a first maximum height of the portion of the fourth surface, the first maximum height of the portion of the fourth surface being a sum of a largest peak height and a largest valley depth obtained within the sampling length from the first cross-sectional curve from the measurement region included in the portion of the fourth surface;
- (c) obtaining a second maximum height of the portion of the fourth surface, the second maximum height of the portion of the fourth surface being a sum of a largest peak height and a largest valley depth obtained within the sampling length from the second cross-sectional curve from the measurement region included in the portion of the fourth surface, and
- (d) averaging the first maximum height of the portion of the fourth surface and the second maximum height of the portion of the fourth surface.
18 more elements
Dependencies are inferred from the claim text.