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US 12,749,282 B2Granted
Systems and methods for real-time point-of-interest detection and overlay
AssigneeAdeia Imaging LLC
InventorsJean-Yves Couleaud, Reda Harb
Life of this patent
Estimating the term…
Abstract
A region of interest is determined based on metadata associated with an image. The region of interest is then sliced into a plurality of slices. POI information is retrieved for each respective slice. An overlay for at least one POI is then generated for display over the image.
Claims20
A method for providing point of interest (POI) information overlayed on an image, the method comprising:
- determining a region of interest based on metadata associated with the image;
- slicing the region of interest into a plurality of slices based on a plurality of elevation profiles identified in the region of interest;
- matching features within each respective slice with known POIs;
- retrieving POI information for the matched features within each respective slice;
- and
- generating for display, as an overlay over the image, POI information for at least one slice of the plurality of slices.
3 more elements
A system for providing point of interest (POI) information overlayed on an image, the system comprising:
- input/output circuitry;
- and
- control circuitry configured to:
- determine a region of interest based on metadata associated with the image;
- slice the region of interest into a plurality of slices based on a plurality of elevation profiles identified in the region of interest;
- match features within each respective slice with known POIs;
- retrieve, using the input/output circuitry, POI information for the matched features within each respective slice;
- and
- generate for display, as an overlay over the image, POI information for at least one slice of the plurality of slices.
6 more elements
Dependencies are inferred from the claim text.