Systems and methods for machine control
AssigneeSim IP Hxr LLC
InventorDavid S. Holz
Life of this patent
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Abstract
A region of space may be monitored for the presence or absence of one or more control objects, and object attributes and changes thereto may be interpreted as control information provided as input to a machine or application. In some embodiments, the region is monitored using a combination of scanning and image-based sensing.
Claims20
A computer-implemented method for conducting machine control, the method comprising:
- coordinating (i) directing an emission cycle to a region of interest in accordance with a scan pattern, (ii) detecting a time-variable reflection signal indicative of a reflection of the emission cycle, and (iii) acquiring images of the region of interest, the directing, the detecting, and the acquiring being coordinated by controlling a variance of the scan pattern according to a detected attribute of an object, wherein the varied scan pattern varies intensities of the emission cycle according to the detected attribute of the object;
- and
- processing the time-variable reflection signal and the images to (i) determine a presence of the object and object attributes and (ii) infer machine-control information from the object attributes.
A non-transitory computer-readable recording medium having a program recorded thereon, the program, when executed by a computer, causes the computer to perform a method comprising:
- coordinating (i) directing an emission cycle to a region of interest in accordance with a scan pattern, (ii) detecting a time-variable reflection signal indicative of a reflection of the emission cycle and (iii) acquiring images of the region of interest, the directing, the detecting, and the acquiring being coordinated by controlling a variance of the scan pattern according to a detected attribute of an object, wherein the varied scan pattern varies intensities of the emission cycle according to the detected attribute of the object;
- and
- processing the time-variable reflection signal and the images to (i) determine a presence of the object and object attributes and (ii) infer machine-control information from the object attributes.
A system for conducting machine control, the system comprising:
- a controller including a processor configured to coordinate:
- (i) directing an emission cycle to a region of interest in accordance with a scan pattern;
- (ii) detecting a time-variable reflection signal indicative of a reflection of the emission cycle;
- and
- (iii) acquiring images of the region of interest;
- the directing, the detecting, and the acquiring being coordinated by controlling a variance of the scan pattern according to a detected attribute of an object, wherein the varied scan pattern varies intensities of the emission cycle according to the detected attribute of the object;
- and
- a computational facility including a processor configured to (i) process the time-variable reflection signal and the images to determine a presence of the object and object attributes and (ii) infer machine-control information from the object attributes.
Dependencies are inferred from the claim text.