Abnormality detection device, abnormality detection method, and non-transitory computer-readable medium storing abnormality detection program
AssigneeKyoto University
InventorsKen Umeno, Atsushi Ohno
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AssigneeKyoto University
InventorsKen Umeno, Atsushi Ohno
Estimating the term…
Prediction accuracy of a regression model in abnormality determination of a TEC value is improved. Processing executed by an abnormality detection device includes: acquiring an observation value of each of a plurality of observation stations; selecting a central observation station from among the plurality of observation stations, and selecting a plurality of peripheral observation stations from among the plurality of observation stations on the basis of a distance from the central observation station; calculating a predicted observation value of the central observation station based on the observation value of each of the plurality of peripheral observation stations; calculating an estimation error between the predicted observation value and an actual measured value of the central observation station; and determining whether or not the actual measured value of the central observation station is abnormal based on the estimation error.
An abnormality detection device comprising:
A method for detecting an abnormality in a number of electrons in an ionosphere, the method comprising:
A non-transitory computer-readable medium storing a program for causing a computer to execute a method, the method comprising:
Dependencies are inferred from the claim text.