Force detection device

A force detection device comprising:

• a force sensor having a detection surface to which force is applied;
• and
• a drive controller configured to control drive of the force sensor, wherein
• the force sensor includes a base, a first circuit formation layer, a sensor layer, and a second circuit formation layer stacked in order in an orthogonal direction orthogonal to the detection surface,
• the first circuit formation layer includes:
• a first surface facing the sensor layer;
• a plurality of first detection electrodes disposed on the first surface and arrayed in a first direction parallel to the detection surface and a second direction parallel to the detection surface and intersecting the first direction;
• a plurality of first switching elements provided to a corresponding one of the first detection electrodes;
• a plurality of first gate lines extending in the first direction, provided in the second direction, and coupled to the first switching elements;
• and
• a first gate line drive circuit configured to drive the first gate lines,
• the second circuit formation layer includes:
• a second surface facing the sensor layer;
• a plurality of second detection electrodes disposed on the second surface and arrayed in the first direction and the second direction;
• a plurality of second switching elements provided to a corresponding one of the second detection electrodes;
• a plurality of second gate lines extending in the first direction, provided in the second direction, and coupled to the second switching elements;
• and
• a second gate line drive circuit configured to drive the second gate lines,
• the first detection electrodes and the second detection electrodes overlap one another when viewed from the orthogonal direction,
• the drive controller:
• selects the first gate lines in order from a first side in the second direction when detecting the force in the first circuit formation layer;
• selects the second gate lines in order from the first side in the second direction when detecting the force in the second circuit formation layer;
• and
• selects, when an n-th first gate line from the first side in the second direction is selected, the second gate line other than an n-th second gate line from the first side in the second direction.