Substrate and method of manufacturing the same
AssigneeSamsung Electro-Mechanics Co., Ltd.
InventorsChanhoon Ko, Chulmin Lee, Inhwan Oh, Kyounghee Lim, Sohyun Bae, Sanghoon Kim
Life of this patent
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Abstract
A substrate includes: a first insulating layer; a second insulating layer disposed on the first insulating layer; and a via hole including a lower hole formed in the first insulating layer, and an upper hole formed in the second insulating layer and connected to the lower hole, in which a width of an upper side of the lower hole is larger than a width of a lower side of the lower hole, and a width of an upper side of the upper hole is larger than a width of a lower side of the upper hole.
Claims26
A substrate comprising:
- a first insulating layer;
- a second insulating layer disposed on the first insulating layer;
- and
- a via hole including a lower hole formed in the first insulating layer, and an upper hole formed in the second insulating layer and connected to the lower hole,
- wherein a width of an upper side of the lower hole is larger than a width of a lower side of the lower hole, and a width of an upper side of the upper hole is smaller than a width of a lower side of the upper hole,
- wherein the width of the upper side of the lower hole is equal to the width of the lower side of the upper hole, and
- wherein a thickness of the first insulating layer is greater than a thickness of the second insulating layer.
A method of manufacturing a substrate, the method comprising:
- stacking a first insulating layer;
- forming a second insulating layer on the first insulating layer, the second insulating layer having a thickness less than a thickness of the first insulating layer;
- forming a sub-hole by primarily removing the second insulating layer and the first insulating layer by emitting a first laser;
- and
- forming a via hole by secondarily removing the second insulating layer and the first insulating layer by emitting a second laser different from the first laser,
- wherein the forming of the via hole comprises forming a lower hole in the first insulating layer and an upper hole in the second insulating layer to connect the upper and lower holes to each other,
- wherein a width of an upper side of the lower hole is larger than a width of a lower side of the lower hole, and a width of an upper side of the upper hole is smaller than a width of a lower side of the upper hole, and
- wherein the width of the upper side of the lower hole is equal to the width of the lower side of the upper hole.
A substrate comprising:
- at least one insulating layer including a first insulating layer and a second insulating layer stacked on one another;
- a lower conductive pattern and an upper conductive pattern disposed at a lower portion and an upper portion of the at least one insulating layer, respectively;
- and
- a connection conductive pattern penetrating through the at least one insulating layer to be connected to the lower and upper conductive patterns,
- wherein a width of a middle portion of the connection conductive pattern is larger than widths of upper and lower portions of the connection conductive pattern,
- wherein the connection conductive pattern includes a lower connection conductive pattern and an upper connection conductive pattern extended from the lower connection conductive pattern,
- wherein a width of an upper side of the lower connection conductive pattern is larger than a width of a lower side of the lower connection conductive pattern, and a width of an upper side of the upper connection conductive pattern is smaller than a width of a lower side of the upper connection conductive pattern,
- wherein the width of the upper side of the lower connection conductive pattern is equal to the width of the lower side of the upper connection conductive pattern,
- wherein the lower connection conductive pattern is disposed in the first insulating layer and the upper connection conductive pattern is disposed in the second insulating layer, and
- wherein a thickness of the first insulating layer is greater than a thickness of the second insulating layer.
Dependencies are inferred from the claim text.