Solid-state imaging element and imaging system

An imaging system, comprising:

• a solid-state imaging element including:
• a lens;
• a first substrate including a photodiode configured to photoelectrically convert incident light into a photocurrent;
• a second substrate including a conversion circuit configured to convert the photocurrent into a voltage signal and a luminance change detection circuit configured to detect a change in luminance of the incident light based on the voltage signal,
• wherein the second substrate is bonded to the first substrate;
• and
• a light shielding unit that is provided in the first substrate and the second substrate and shields light between an active element provided in the second substrate and the photodiode,
• wherein the light shielding unit includes a light shielding wiring provided in a second wiring layer provided between a semiconductor layer of the second substrate that includes the active element and the first substrate,
• wherein the light shielding wiring extends beyond the active element in a horizontal direction such that a portion of the light shielding wiring does not overlap the active element in a plan view, and
• wherein a horizontal length of the non-overlapping portion of the light shielding wiring is greater than a vertical length between the light shielding wiring and the active element;
• and
• a signal processing chip that performs signal processing on an output from the solid-state imaging element.