Radial line slot antenna arrays
AssigneeBAE SYSTEMS plc
InventorAshley Lloyd Wade
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Abstract
In some examples, a method for manufacturing a switching structure for a radial slot line antenna, RLSA, array using a single semiconductor wafer element, comprises forming a set of active switching devices within the wafer element, a position of each active switching device on the wafer element selected according to a predefined configuration representing a slot element layout for the RLSA array, and forming driving circuitry within the wafer element, the driving circuitry for individually addressing respective ones of the set of active switching devices, whereby to enable selected bias signals to be applied to the set of active switching devices.
Claims15
A method for manufacturing a switching structure for a radial line slot antenna (RLSA) array using a single semiconductor wafer element, the method comprising:
- forming a set of active switching devices within the wafer element, a position of each active switching device on the wafer element selected according to a predefined configuration representing a slot element layout for the RLSA array;
- and
- forming driving circuitry within the wafer element, the driving circuitry for individually addressing respective ones of the set of active switching devices, whereby to enable selected bias signals to be applied to the set of active switching devices.
A radial line slot antenna array, comprising:
- a substrate comprising a radiating surface for the array, the radiating surface comprising multiple slots arranged in a predefined configuration representing a slot element layout for the radial line slot antenna array;
- a set of active switching devices integrally formed in a semiconductor wafer element bonded to the substrate, each switching device structurally aligned with a respective slot, whereby to enable regulation of slot element resonant frequencies;
- a plurality of bias control lines integrally formed in the semiconductor wafer element;
- and
- driving circuitry integrally formed in the semiconductor wafer element and configured to individually address the active switching devices, whereby to enable selected bias signals to be applied to the active switching devices using the bias control lines.
Dependencies are inferred from the claim text.