Semiconductor device and method of manufacturing the same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorMeng-Sheng Chang
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorMeng-Sheng Chang
Estimating the term…
A memory device includes peripheral transistors formed along a first surface of a substate; memory cells formed in one or more of first metallization layers disposed over the first surface, each of the memory cells being operatively coupled to a subset of the peripheral transistors and including a programming transistor and at least a first reading transistor; and second metallization layers disposed over a second surface of the substrate opposite to the first surface. A first source/drain terminal of the first reading transistor is in electrical connection with a first source/drain terminal of the programming transistor. A second source/drain terminal of the first reading transistor is in electrical connection with a bit line that is formed in a corresponding one of the second metallization layers.
A memory device, comprising:
A memory device, comprising:
A method for forming memory devices, comprising:
Dependencies are inferred from the claim text.