System and method for measurement of radio frequency signal pattern using plane wave
AssigneeYttek Technology Corp.
InventorsFang-Yao Kuo, Wen-Chiang Chen, Hao-Ju Huang
Life of this patent
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Abstract
A system for measuring a signal pattern includes: a first reflector including a first reflector surface configured to generate a plane wave; a second reflector including a second reflector surface configured to generate a plane wave; a path-guiding member coupled to the first reflector and the second reflector, and configured to move the first reflector and the second reflector along a predetermined path; a stage configured to hold a device under test (DUT); and a first signal transceiver configured to transmit a signal to, or receive the signal from, at least one of the first reflector, the second reflector and the DUT.
Claims20
A system for measuring a signal pattern, comprising:
- a first reflector comprising a first reflector surface configured to generate a plane wave;
- a second reflector comprising a second reflector surface configured to generate a plane wave;
- a path-guiding member coupled to the first reflector and the second reflector, and configured to move the first reflector and the second reflector along a predetermined path;
- a stage configured to hold a device under test (DUT), the DUT having a surface;
- and
- a transceiver configured to transmit a first signal to one of the first reflector and the second reflector, and receive the first signal reflected by the surface of the DUT from the other one of the first reflector and the second reflector.
A method for measuring a signal pattern, the method comprising:
- disposing a device under test (DUT) on a stage, the DUT having a surface;
- coupling a first reflector and a second reflector to a path-guiding member, wherein each of the first reflector and the second reflector is configured to be moved along a predetermined path defined by the path-guiding member, and comprises a reflector surface configured to generate a plane wave;
- transmitting a first signal from one of the first reflector and the second reflector;
- and
- in response to the transmitted first signal, causing reflection of the first signal from the surface of the DUT and reception of the first signal from the other one of the first reflector and the second reflector.
Dependencies are inferred from the claim text.