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AssigneeUnchained Labs
InventorsDavid S. Freedman, George G. Daaboul, Steven M. Scherr, Chetan Sood, Leif Stefan Anderson, Dennis Alexander Zimmermann, Mubtasim Akhyar, Gregg Lithgow
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Presented herein are systems and methods for analyzing images of target particles that are bound to a surface of a substrate. In certain embodiments, systems and method described herein utilize techniques that remove background noise from interferometric images of small particles, allowing for increased accuracy in detection and/or characterization of individual particles. Such techniques, as described herein, may allow individual particles having sizes below about 100 nm (e.g., below about 50 nm; e.g., down to 20 nm) to be accurately detected within images, and, among other things, their characteristic sizes measured utilizing, e.g., their contrast.
A method for reducing background in an interferometric image via a three-dimensional (3D) image registration and background correction, the method comprising:
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