Resistive thermometer excitation and calibration
AssigneeAnalog Devices, Inc.
InventorsMichael C.W. Coln, Phillip Michel Nadeau, Qingdong Meng
Life of this patent
Estimating the term…
Loading patent…
AssigneeAnalog Devices, Inc.
InventorsMichael C.W. Coln, Phillip Michel Nadeau, Qingdong Meng
Estimating the term…
Circuitry and measurement approaches are described herein that can be used to reduce or suppress sensitivity to variation of sensor properties or characteristics over time for a respective monolithically integrated resistive temperature sensor. Such measurement approaches can also help to suppress measurement variations between sensors, such as to provide stable temperature measurement characteristics across locations and over time for the respective different temperature measurement sites on or within the integrated circuit package. The approaches described herein can also reduce or suppress sensitivity to variation in excitation source characteristics, such as using a relative indication (e.g., a ratio) of measured signal values corresponding to a respective temperature sensor and a co-integrated reference device. Calibration or absolute temperature measurements can be performed, such as using an off-chip (e.g., off-die or off-package) calibration reference. The off-chip calibration reference can be used to establish calibration data for other measurements.
A method for localized measurement of temperature using an integrated temperature sensor circuit, the method comprising:
An integrated circuit, comprising:
An integrated circuit, comprising:
Dependencies are inferred from the claim text.