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US 12,742,662 B2Granted
Inertial measurement device
AssigneeSeiko Epson Corporation
InventorYasunori Hiyoshi
Life of this patent
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Abstract
A inertial measurement device includes: a first inertial measurement unit to an n-th inertial measurement unit; a relay circuit configured to receive first detection data to n-th detection data from the first inertial measurement unit to the n-th inertial measurement unit and output the first detection data to the n-th detection data as output data in a time-division manner; and a processing device configured to receive the output data from the relay circuit and perform synthesis processing on the first detection data to the n-th detection data.
Claims14
An inertial measurement device comprising:
- a first inertial measurement unit to an n-th inertial measurement unit;
- a relay circuit configured to receive first detection data to n-th detection data from the first inertial measurement unit to the n-th inertial measurement unit and output the first detection data to the n-th detection data as output data in a time-division manner;
- and
- a processing device configured to receive the output data from the relay circuit and perform synthesis processing on the first detection data to the n-th detection data.
1 more element
Dependencies are inferred from the claim text.