Automated application of drift correction to sample studied under electron microscope

A microscope control system for measuring electron dose in a sample with a transmission electron microscope (TEM), the system comprising:

• one or more hardware processors configured for:
• locating a fiducial mark on a TEM holder tip, wherein the TEM holder tip includes a through-hole located at a predetermined distance from the fiducial mark and a current collection area located at a predetermined distance from the fiducial mark;
• calibrating the TEM for measuring beam area across a range of possible beam areas using the located fiducial mark;
• calibrating the TEM for measuring beam current across a range of possible beam currents using the located fiducial mark;
• measuring electron dose on the sample during an experiment using the calibrated TEM;
• and
• reducing an electron dose rate when a critical value for the electron dose rate or a cumulative electron dose has been reached.

A microscope control system for measuring electron dose in a sample with a transmission electron microscope (TEM), the system comprising:

• one or more hardware processors configured for:
• locating a fiducial mark on a TEM holder tip, wherein the TEM holder tip includes a through-hole located at a predetermined distance from the fiducial mark and a current collection area located at a predetermined distance from the fiducial mark;
• calibrating the TEM for measuring beam area across a range of possible beam areas using the located fiducial mark;
• calibrating the TEM for measuring beam current across a range of possible beam currents using the located fiducial mark;
• measuring electron dose on the sample for a plurality of positions on the sample during an experiment using the calibrated TEM;
• and
• generating and displaying a heatmap of the sample showing the measured electron dose for X-Y coordinates for the plurality of positions on the sample.