Charged particle beam device
AssigneeHitachi High-Tech Corporation
InventorsHirohisa Enomoto, Kenichi Nishinaka
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi High-Tech Corporation
InventorsHirohisa Enomoto, Kenichi Nishinaka
Estimating the term…
A charged particle beam device includes: an inclination mechanism driving unit configured to generate a driving force; an inclination driving force transmission unit configured to transmit the driving force; and an inclination mechanism unit having first and second load transmission units, first, second and third deformation units, and an inclinable sample holding unit. The first load transmission unit moves in a load direction by the load from the inclination driving force transmission unit and transmits the load to the first deformation unit. The second load transmission unit rotates about the second deformation unit as a fulcrum by a torque generated by deformation of the first deformation unit and transmits the load to the third deformation unit. The sample holding unit rotates about the fourth deformation unit as a fulcrum opposite to a direction of the second load transmission unit by a torque generated by deformation of the third deformation unit.
A charged particle beam device comprising:
A sample holder comprising:
A sample insertion structure comprising:
A method of controlling a position of a sample using a sample holder, wherein
Dependencies are inferred from the claim text.