Observation apparatus and observation method
AssigneeKYOCERA Corporation
InventorAtsushi Yoshikawa
Life of this patent
Estimating the term…
Abstract
An observation apparatus includes a controller. The controller performs calibration based on a feature point set for a first region among the first region, a second region, and a third region and information on a position of the feature point in a real space. The controller acquires information on a position, in the real space, of a predetermined point in an observation region of a first sensor or an observation region of a second sensor. The first region corresponds to both the observation region of the first sensor and the observation region of the second sensor. The second region corresponds to the observation region of the first sensor and does not overlap the first region. The third region corresponds to the observation region of the second sensor and does not overlap the first region.
Claims13
An observation apparatus comprising:
- a controller configured to:
- perform calibration based on a feature point set for a first region, a second region, and a third region, and information on a position of the feature point in a real space, the first region corresponding to both an observation region of a first sensor and an observation region of a second sensor, the second region corresponding to the observation region of the first sensor and not overlapping the first region, the third region corresponding to the observation region of the second sensor and not overlapping the first region;
- and acquire information on a position, in the real space, of a predetermined point in the observation region of the first sensor or the observation region of the second sensor.
An observation method comprising:
- performing calibration based on a feature point set for a first region, a second region, and a third region, and information on a position of the feature point in a real space, the first region corresponding to both an observation region of a first sensor and an observation region of a second sensor, the second region corresponding to the observation region of the first sensor and not overlapping the first region, the third region corresponding to the observation region of the second sensor and not overlapping the first region;
- and acquiring information on a position, in the real space, of a predetermined point in the observation region of the first sensor or the observation region of the second sensor.
Dependencies are inferred from the claim text.