Guided testing regime generation and selection
AssigneeJMP Statistical Discovery LLC
InventorsRyan Adam Lekivetz, Joseph Albert Morgan, Jacob Davis Rhyne
Life of this patent
Estimating the term…
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AssigneeJMP Statistical Discovery LLC
InventorsRyan Adam Lekivetz, Joseph Albert Morgan, Jacob Davis Rhyne
Estimating the term…
An apparatus includes a processor to: present a prompt to select a first pathway to traverse from among a set including a test-focused pathway of initial test-related parameter prompts followed by subsequent prompts for model-related or term-related parameters, a model-focused pathway of initial model-related parameter prompts followed by subsequent prompts for test-related or term-related parameters, and a term-focused pathway of initial term-related parameter prompts followed by subsequent prompts for test-related or model-related parameters; traverse the first pathway by presenting the initial prompts followed by the subsequent prompts of the first pathway, and receiving initial or subsequent parameter value(s); present a prompt to select a second pathway, different from the first pathway, to traverse from among the set; and traverse the second pathway by presenting the initial prompts followed by the subsequent prompts of the second pathway, and receiving initial or subsequent parameter value(s).
An apparatus comprising at least one processor and a storage to store instructions that, when executed by the at least one processor, cause the at least one processor to perform operations comprising:
A computer-program product tangibly embodied in a non-transitory machine-readable storage medium, the computer-program product including instructions operable to cause at least one processor to perform operations comprising:
A computer-implemented method comprising:
Dependencies are inferred from the claim text.