Insert inserted to tray for transporting semiconductor products, tray including the insert, and semiconductor product test system including the insert
AssigneeAteco Inc.
InventorsTaek Seon Lee, Ho Nam Kim, Sung Chul Moon, Han Su Bae
Life of this patent
Estimating the term…
Abstract
A test tray for testing a semiconductor product according to an embodiment of the disclosure may include a tray and an insert comprising an accommodating portion configured to accommodate the semiconductor product and inserted into the tray. The accommodating portion may have a first posture at a first angle to the tray to accommodate the semiconductor product, and a second posture at a second angle to the tray to test the semiconductor product.
Claims14
A test tray for testing a semiconductor product, comprising:
- a tray;
- and
- an insert comprising an accommodating portion configured to accommodate the semiconductor product, and inserted into the tray;
- and
- wherein the accommodating portion having a first posture at a first angle to the tray to accommodate the semiconductor product, and a second posture at a second angle to the tray to test the semiconductor product,
- wherein the insert further comprises a mounting portion mounted to the tray and supporting the accommodating portion adjustable in angle to the tray, and
- wherein the accommodating portion comprises a rotary body formed with a mounting slot to accommodate the semiconductor product and supported to be adjustable in angle on the mounting portion.
A test tray for testing a semiconductor product, comprising:
- a tray comprising a plurality of grooves;
- and
- an insert configured to accommodate the semiconductor product therein and inserted to the tray so as to be located in the groove,
- the semiconductor product comprising a first type semiconductor product with terminals located on a lower side thereof, and a second type semiconductor product with terminals located on a lateral side thereof,
- the insert comprising a first type insert that accommodates the first type semiconductor product therein and exposes a lower end of the first type semiconductor product to a lower side of the tray, and a second type insert that accommodates the second type semiconductor product therein and has a first posture where an entrance through which the second type semiconductor product enters and exits is exposed to an upper side of the tray and a second posture where a lateral side of the accommodated second type semiconductor product is exposed to a lower side of the tray, and
- the tray allowing the first type insert or the second type insert to be selectively inserted thereto.
An insert inserted to a tray for transporting a semiconductor product, comprising:
- an accommodating portion formed with a mounting slot to accommodate the semiconductor product;
- and
- a mounting portion supporting the accommodating portion to be switchable in posture, and
- the accommodating portion having a first posture where an entrance of the mounting slot is exposed to an upper external space of the mounting portion, and a second posture where the mounting slot is exposed to a lower external space of the mounting portion.
A semiconductor product test system comprising:
- a tray comprising a groove;
- an insert configured to accommodate a semiconductor product therein, inserted to the tray to be located in the groove, and having a first posture at a first angle to the tray and a second posture at a second angle to the tray;
- and
- a posture switching unit configured to switch the posture of the insert by pressurizing one side of the insert to change an angle of the insert.
Dependencies are inferred from the claim text.