Tamper-aware age sensor

A sensor comprising:

• a performance monitor configured to be responsive to temperature stress and voltage stress, wherein the performance monitor is configured to receive a nominal operating voltage of an integrated circuit as an input signal when the sensor is operated in a regular use mode, thereby causing the performance monitor to experience a first performance degradation, wherein the performance monitor is configured to generate a first output signal indicative of the first performance degradation when the sensor is operated in a readout mode;
• and
• an anneal monitor configured to be responsive to temperature stress,
• wherein the anneal monitor is pre-stressed and configured to account for a first accelerated relaxation of the first performance degradation during a fraudulent anneal attempt and account for a second accelerated relaxation of a second performance degradation of the anneal monitor during the fraudulent anneal attempt, wherein the anneal monitor is configured to generate a second output signal indicative of the second performance degradation.