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US 12,736,485 B2Granted
Multi-fraction sample holder for 3D particle analysis
AssigneeCarl Zeiss X-ray Microscopy, Inc.
InventorMatthew Andrew
Life of this patent
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Abstract
An x-ray minerology analysis system includes a sample assembly for an x-ray microscopy system. It comprises an outer tube and a bottom plug sealing an inner bore of the outer tube, wherein the outer tube contains powder to be analysed by the x-ray microscopy system.
Claims17
A sample assembly for an x-ray microscopy system, comprising:
- an outer tube;
- a bottom plug sealing an inner bore of the outer tube, wherein the outer tube contains powder to be analyzed by the x-ray microscopy system;
- and
- spacers inserted into the outer tube for separating multiple samples in the outer tube,
- wherein the spacers are discrete from each other and not connected to each other such that they can be separately inserted into the outer tube.
2 more elements
An x-ray microscopy system, comprising:
- a source of generating x-rays;
- a sample holder for holding samples in the beam;
- a sample assembly held by the sample holder, including an outer tube that contains powder samples and spacers inserted into the outer tube for separating multiple samples in the outer tube, wherein the outer tube comprises a bottom plug sealing an inner bore of the outer tube, and a portion of the bottom plug extends beyond an end of the outer tube to engage with the sample holder;
- wherein the spacers are discrete from each other and not connected to each other such that they can be separately inserted into the outer tube;
- and
- a detector for detecting the beam after interaction with the samples.
3 more elements
A method of operation of an x-ray microscopy system, the method comprising:
- introducing a first powder sample into an inner bore of an outer tube of a sample assembly of the x-ray microscopy system by packing the first powder sample against a top end of a bottom plug that seals a bottom end of the outer tube;
- placing a first spacer in the outer tube over the first powder sample;
- introducing a second powder sample into the inner bore over the first spacer;
- repeating placement of spacers and introduction of powder samples over the spacers to load multiple powder samples separated from each other by the spacers in the inner bore of the outer tube, wherein the spacers are discrete from each other and not connected to each other such that they can be separately inserted into the outer tube;
- generating x-rays;
- holding samples in the beam with the sample assembly;
- and
- detecting the beam after interaction with the samples.
5 more elements
Dependencies are inferred from the claim text.