Measurement instrument, measurement device, measurement system, and measurement method
AssigneeHORIBA Advanced Techno, Co., Ltd.
InventorsKeisuke Sasai, Issei Kobayashi, Kazuhiro Irie, Wataru Kinoshita
Life of this patent
Estimating the term…
Loading patent…
AssigneeHORIBA Advanced Techno, Co., Ltd.
InventorsKeisuke Sasai, Issei Kobayashi, Kazuhiro Irie, Wataru Kinoshita
Estimating the term…
A measurement instrument comprises a cylindrical cell that stores a measurement fluid, a drive mechanism that rotates the cell about a central axis, a first light source that is arranged outside the cell and irradiates the measurement fluid with first inspection light, a second light source that is arranged outside the cell and at a position different from the first light source in a rotation direction of the cell, and irradiates the measurement fluid with second inspection light, a detector that is arranged outside the cell and detects transmitted light of the first inspection light transmitted through the measurement fluid and scattered light of the second inspection light scattered by the measurement fluid, and a cleaning mechanism that is arranged inside the cell and comes into contact with and clean an inner peripheral surface of the cell.
A measurement instrument comprising:
A measurement method using a measurement instrument, the measurement instrument including:
Dependencies are inferred from the claim text.