Measurement device and measurement method and measurement program therefor
AssigneeAlps Alpine Co., Ltd.
InventorTomoki Yamada
Life of this patent
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AssigneeAlps Alpine Co., Ltd.
InventorTomoki Yamada
Estimating the term…
A measurement device includes N (N≥2) sensors, a selection unit configured to select a predetermined combination of sensors in each measurement and output a detection value to each of M (M<N) sensor terminals based on measurement values provided by the selected sensors, a detection unit configured to acquire the detection value output to each of the M sensors in each measurement, and a correction unit configured to, after the measurement is performed L times, based on an assumption that each of M×L detection values acquired by the acquisition unit includes a time-dependent noise component, correct each of the M×L detection values such that the time-dependent noise component of each of the detection values is replaced by a common noise component obtained by averaging the L time-dependent noise components along a time axis.
A measurement device comprising:
A measurement method using a measurement device including a plurality N (N≥2) of capacitive sensors configured to measure a capacitance change associated with an object, the method comprising:
A non-transitory computer-readable storage device, tangibly embodying a measurement program for a measurement device including a plurality N (N≥2) of capacitive sensors configured to measure a capacitance change associated with an object, the storage device being configured to cause a computer to execute process steps, the process steps comprising:
Dependencies are inferred from the claim text.