Image processing apparatus, radiation imaging system, image processing method, and storage medium
AssigneeCanon Kabushiki Kaisha
InventorsAtsushi Iwashita, Kosuke Terui, Ryuichi Fujimoto
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Abstract
An image processing apparatus includes a processing unit configured to, by using a plurality of pieces of information that correspond to a plurality of mutually different radiation energies and that have been obtained by irradiating an object with radiation and performing imaging, and information regarding transmittance including scattered rays and transmittance not including the scattered rays that is set in advance for each of multiple thicknesses of a first material and a second material that is different from the first material, obtain thickness images of the first and second materials in which the scattered rays have been corrected.
Claims15
An image processing apparatus, comprising:
- a processing unit configured to obtain thickness images of first and second materials in which scattered rays have been corrected using a plurality of pieces of information that correspond to a plurality of mutually different radiation energies and that have been obtained by irradiating an object with radiation and performing imaging, and information regarding transmittance including scattered rays and transmittance not including the scattered rays that is set in advance for each of multiple thicknesses of a first material and a second material that is different from the first material;
- and
- a storage unit configured to store information regarding the transmittance obtained for each of multiple thicknesses of a predetermined material for each of a first radiation energy and a second radiation energy that is different from the first radiation energy;
- the processing unit being configured to obtain information regarding transmittance that corresponds to a thickness of the predetermined material by performing correction of the information stored in the storage unit, the information regarding transmittance including the scattered rays obtained for each combination of a thickness of the first material and a thickness of the second material is stored in the storage unit;
- and
- the processing unit being configured to obtain information regarding transmittance including the scattered rays for the combination by performing correction of the information obtained from the storage unit based on the combination, wherein
- when the scattered rays are not included in the first radiation energy, the processing unit is configured to generate a first function that outputs information regarding transmittance from a combination of a thickness of the first material and a thickness of the second material including the scattered rays for the combination,
- when the scattered rays are not included in the second radiation energy, the processing unit is configured to generate a second function that outputs information regarding transmittance from a combination of a thickness of the first material and a thickness of the second material including the scattered rays for the combination, and
- the processing unit is configured to obtain a first change rate of the first function and a second change rate of the second function based on a change in thickness of the first material, and to obtain a third change rate of the first function and a fourth change rate of the second function based on a change in thickness of the second material.
An image processing method, comprising:
- obtaining thickness images of first and second materials in which scattered rays have been corrected using a plurality of pieces of information that correspond to a plurality of mutually different radiation energies and that have been obtained by irradiating an object with radiation and performing imaging, and information regarding transmittance including scattered rays and transmittance not including the scattered rays that is set in advance for each of multiple thicknesses of a first material and a second material that is different from the first material;
- storing information regarding the transmittance obtained for each of multiple thicknesses of a predetermined material for each of a first radiation energy and a second radiation energy that is different from the first radiation energy;
- and
- obtaining information regarding transmittance that corresponds to a thickness of the predetermined material by performing correction of the stored information, the information regarding transmittance including the scattered rays obtained for each combination of a thickness of the first material and a thickness of the second material, wherein
- obtaining information regarding transmittance by performing correction of the information obtained from the storage unit based on the combination, including the scattered rays for the combination,
- when the scattered rays are not included in the first radiation energy, generating a first function that outputs information regarding transmittance including the scattered rays for the combination, from a combination of a thickness of the first material and a thickness of the second material,
- when the scattered rays are not included in the second radiation energy, generating a second function that outputs information regarding transmittance including the scattered rays for the combination, from a combination of a thickness of the first material and a thickness of the second material, and
- obtaining a first change rate of the first function and a second change rate of the second function based on a change in thickness of the first material, and obtaining a third change rate of the first function and a fourth change rate of the second function based on a change in thickness of the second material.
Dependencies are inferred from the claim text.