Substrate including test circuit and substrate test apparatus including the substrate

A substrate test apparatus comprising:

• a substrate including a substrate body, and a test circuit on at least one of an upper surface and a lower surface of the substrate body;
• and
• a test element configured to test the substrate,
• wherein the test circuit comprises two contact pads and at least one test wiring, the two contact pads being at an end portion of the substrate body and configured to contact two probe pins of the test element, the at least one test wiring extending to surround a first outer periphery portion of the substrate body and configured to connect the two contact pads to each other, the at least one test wiring being a single integral body, and
• in an electrical test using the test element, the substrate test apparatus is configured to determine the substrate as normal when the at least one test wiring is in a closed state, and determine the substrate as defective when the at least one test wiring is in an open state.

A substrate test apparatus comprising:

• a substrate including a substrate body and a test circuit, the test circuit on at least one of an upper surface and a lower surface of the substrate body;
• a test element configured to test the substrate;
• and
• a substrate movement apparatus configured to move the substrate, the substrate movement apparatus having at least some components of the test element thereon,
• wherein the test circuit comprises two contact pads and at least one test wiring, the two contact pads being at an end portion of the substrate body and configured to contact two probe pins of the test element, the at least one test wiring extending to surround an outer periphery portion of the substrate body and configured to connect the two contact pads to each other, the at least one test wiring being a single integral body,
• when the substrate movement apparatus contacts the substrate, the test element is configured to perform an electrical test on the substrate, and
• in the electrical test, the substrate test apparatus is configured to determine the substrate as normal when the at least one test wiring is in a closed state, and determine the substrate as defective when the at least one test wiring is in an open state.