Memory device health monitoring logic

A method, comprising:

• measuring a health parameter of a memory device using health monitoring logic of the memory device;
• storing a first value associated with the health parameter in a register of the memory device based at least in part on measuring the health parameter, wherein the first value is used to perform a responsive operation;
• identifying, using a self-check logic, a state of the health monitoring logic of the memory device used to generate the first value;
• and
• storing a second value indicating the state of the health monitoring logic in the register based at least in part on identifying the state of the health monitoring logic, wherein the second value is used to flag a fault associated with the first value, wherein the responsive operation comprises at least one of replacing the memory device, operating the memory device in a safe mode, or continuing to monitor the memory device.

An apparatus, comprising:

• logic operable to couple with a memory device, the logic configured to cause the apparatus to:
• read, from a register of the memory device, a first value indicating a health parameter of the memory device measured using health monitoring logic of the memory device, wherein the first value is used to perform a responsive operation;
• read, from the register, a second value indicating a state of the health monitoring logic used to generate the first value, the second value determined using a self-check logic, wherein the second value is used to flag a fault associated with the first value;
• and
• perform the responsive operation associated with the first value based at least in part on the second value, wherein the responsive operation comprises at least one of replacing the memory device, operating the memory device in a safe mode, or continuing to monitor the memory device.