Probe card device having expansion configuration and probe head thereof

A probe card device having an expansion configuration, comprising:

• a circuit board;
• a first guide board module including a connection circuit;
• a second guide board module spaced apart from the first guide board module along a thickness direction and arranged between the circuit board and the first guide board module;
• a plurality of conductive probes assembled to the first guide board module and the second guide board module, wherein at least one of the conductive probes abuts against the connection circuit, and each of the conductive probes includes:
• a fixing segment protruding from the second guide board module and fixed to the circuit board;
• and
• a testing segment protruding from the first guide board module and configured to detachably abut against one of metal pads of a device under test (DUT);
• and
• at least one auxiliary probe assembled to the first guide board module and the second guide board module, wherein the at least one auxiliary probe abuts against the connection circuit so as to be electrically coupled to the at least one of the conductive probes, and wherein the at least one auxiliary probe includes:
• a connection segment protruding from the second guide board module and fixed to the circuit board;
• and
• an assembling segment fixed in the first guide board module, wherein the assembling segment is configured to face toward the DUT along the thickness direction and is not in contact with the DUT.