US 12,730,062 B2Granted

Polarizer and analyzer configuration optimization method and polarizing and analyzing system

AssigneeTsinghua Shenzhen International Graduate School

InventorsHui Ma, Qianhao Zhao, Zheng Hu, Tongyu Huang

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Abstract

A PSG and PSA configuration optimization method and a polarizing and analyzing system, wherein the method comprises the following steps: adjusting an instrumental matrix W of a PSG and an instrumental matrix A of an PSA to minimize a weighted variance EWV of the instrument matrices of the PSG and the PSA, so as to realize optimization for Gaussian noise; and a sum of each row of the instrumental matrix W of the PSG and the instrumental matrix A of the PSA is 0, so that an estimated variance caused by Poisson noise is independent of the sample, and the estimated variance reaches a minimum value. The present disclosure can suppress the noise to the maximum extent and make the law of the noise independent from the sample, and the distribution law of the noise is the same regardless of the sample to be measured.

Claims4

Dependent claims

A PSG and PSA configuration optimization method, comprising the steps of:

adjusting an instrumental matrix W of a PSG and an instrumental matrix A of an PSA to minimize an equal-weighted variance EWV of the instrument matrices of the PSG and the PSA, so as to realize optimization for Gaussian noise;
and
a sum of each row of the instrumental matrix W of the PSG and the instrumental matrix A of the PSA is zero, so that an estimated variance due to Poisson noise is independent of a sample, and the estimated variance reaches a minimum value,
wherein the PSG and the PSA of a measurement system are configured so that their polarization states are mutually orthogonal:
then a minimum equal-weighted variance EWV of the instrument matrices of the PSG and the PSA are searched:
an optimal configuration is achieved when the instrument matrices of the PSG and PSA satisfy conditions of the sum of rows being zero and minimum EWV simultaneously:
wherein when the PSG and the PSA are a rotating polarizing plate and a rotating quarter-wave plate, respectively, a configuration condition for making the polarization states of the PSG and the PSA mutually orthogonal satisfies the following relationship:
θ
P
′
=
θ
P
+
90
⁢
°
in the formula, θp is a direction of a light transmission axis of the polarizing plate configured for a first measurement, θR is an angular direction of a fast axis of the quarter-wave plate configured for the first measurement, θp′ is a direction of the light transmission axis of the polarizing plate configured for a second measurement, and θR′ is an angular direction of the fast axis of the quarter-wave plate configured for the second measurement;
the method adjusts a main light passing direction of polarization via the polarizing plate and then realizes modulation of a specific polarization state via the quarter-wave plate.

16 more elements

A polarizing and analyzing system, wherein it is configured such that a sum of each row of an instrumental matrix W of a PSG and an instrumental matrix A of an PSA is zero, and an equal-weighted variance EWV of the instrument matrices of the PSG and the PSA is minimum, so as to optimize a performance of a Müller measurement system against Gaussian-Poisson mixed noise;

the polarizing and analyzing system comprises one rotating polarizing plate and one rotating quarter-wave plate, which are configured as follows:
number of
collection points
parameters
actual configuration
4
θP
4.87°, 85.13°, 94.87°, 175.13°
θQ
22.50°, 67.50°, 112.50°, 157.50°
4
θP
130.13°, 139.87°, 40.13°, 49.87°
θQ
112.50°, 157.50°, 22.50°, 67.50°
8
θP
19.27°, 109.27°, 163.89°, 73.89°
26.08°, 116.08°, 118.57°, 28.57°
θQ
180.00°, 180.00°, 179.88°, 179.88°
43.76°, 43.76°, 136.09°, 136.09°
alternatively, the polarizing and analyzing system comprises one fixed polarizing plate, one rotating half-wave plate and one rotating quarter-wave plate, which are configured as follows:
number of
collection points
parameters
actual configuration
4
θP
0°
θH
2.433°, 42.567°, 137.433°, 87.567°
θQ
22.50°, 67.50°, 112.50°, 157.50°
4
θP
0°
θH
47.433°, 177.567°, 2.433°, 42.567°
θQ
22.50°, 67.50°, 112.50°, 157.50°
8
θP
0°
θH
171.46°, 36.46°, 0.33°, 45.44°
129.11°, 174.11°, 160.58°, 25.58°
θQ
155.71°, 155.71°, 8.14°, 8.14°
127.84°, 127.84°, 36.82°, 36.82°
alternatively, the polarizing and analyzing system comprises one fixed polarizing plate and two full-wave retardation phase modulation devices, which are configured as follows:
number of
collection points
parameters
actual configuration
4
θP
0°
θF1
45°
θF2
0°
δF1
305.26°, 234.74°, 125.26°, 54.74°
δF2
225.00°, 315.00°, 315.00°, 225.00°
4
θP
0°
θF1
45°
θF2
0°
δF1
234.74°, 305.26°, 54.74°, 125.26°
δF2
45.00°, 135.00°, 135.00°, 45.00°
8
θP
0°
θF1
45°
θF2
0°
δF1
105.04°, 285.04°, 292.52°, 112.52°
δF2
185.96°, 185.96°, 66.94°, 66.94°
alternatively, the polarizing and analyzing system comprises one fixed polarizing plate and two half-wave retardation phase modulation devices, which are configured as follows:
number of
collection points
parameters
actual configuration
4
θP
22.5°
θH1
67.5°
θH2
90°
δH1
35.26°, 144.74°, 144.74°, 35.26°
δH2
0°, 180°, 0°, 180°
4
θP
−22.5°
θH1
22.5°
θH2
45°
δH1
35.26°, 144.74°, 144.74°, 35.26°
δH2
0°, 180°, 0°, 180°.

112 more elements

Dependencies are inferred from the claim text.

Facts

Application: 18/415,388Filed 17 Jan 2024 · continuation in part
Priority: CN 202110811657.619 Jul 2021
Published: US 2024/0167941 A123 May 2024
Granted: 8 Sep 2026
Term ends: Not estimatedThe source records don’t support an estimate.

Classification8 codes

G01N 21/21
Systems in which incident light is modified in accordance with the properties of the material investigated: polarisation-affecting properties
G01J 4/04
Measuring polarisation of light: polarimeters using electric detection means
G02B 27/286
For polarising: for controlling or changing the state of polarisation, e.g. transforming one polarisation state into another
G02F 1/0136
For the control of the intensity, phase, polarisation or colour: for the control of polarisation, e.g. state of polarisation [SOP] control,…