Peak position measurement offset in a two-dimensional optical spectrum
AssigneesThermo Fisher Scientific (Shanghai) Instruments Co., Ltd., Thermo Fisher Scientific (Bremen) GmbH
InventorsShenghai Wu, Antonella Guzzonato, Cheng Wang
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Abstract
A peak position measurement offset is determined in a two-dimensional optical spectrum. A plurality of peaks are identified that appear in both a spectrum obtained from a reference material at known conditions and a spectrum obtained from a sample of interest. The peak position measurement offset is determined by a comparison of a pattern formed by peak positions of the plurality of identified peaks in the spectrum obtained from the sample of interest against the plurality of identified peaks in the spectrum obtained from the reference material.
Claims18
A method of determining a peak position measurement offset in a two-dimensional optical spectrum, the method comprising:
- identifying a plurality of peaks that appear in both:
- a spectrum obtained from a reference material at known conditions;
- and a spectrum obtained from a sample of interest;
- and
- determining the peak position measurement offset by a comparison of a pattern formed by peak positions of the plurality of identified peaks in the spectrum obtained from the sample of interest against the spectrum obtained from the reference material,
- wherein the plurality of identified peaks comprises at least three peaks, and wherein positions of the plurality of identified peaks in the two-dimensional optical spectrum define vertices of an asymmetric polygon.
Dependencies are inferred from the claim text.