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US 12,729,320 B2Granted
Anti-reflection substrate
AssigneeMitsubishi Gas Chemical Company, Inc.
InventorsYoshiaki Yamamoto, Shota Wakayama
Life of this patent
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Abstract
Provided is an antireflection substrate formed by laminating the following layers (A), (B), (C) and (D) in this order: a substrate layer (A), a hard coating layer (B), a light absorbing layer (C), and a low refractive index layer (D), formed by curing a low refractive index resin composition containing an active energy ray-curable resin, hollow silica and a fluorine compound by an active energy ray, where the film thickness of the light absorbing layer (C) is 1 to 20 nm.
Claims4
An antireflection substrate formed by laminating the following layers (A), (B), (C) and (D) in this order:
- a substrate layer (A),
- a hard coating layer (B),
- a light absorbing layer (C), and
- a low refractive index layer (D), formed by curing a low refractive index resin composition containing an active energy ray-curable resin, hollow silica and a fluorine compound by an active energy ray, wherein
- a film thickness of the light absorbing layer (C) is 2 to 15 nm,
- wherein the light absorbing layer (C) is formed by a dry film formation selected from CVD and PVD,
- the active energy ray-curable resin in the low refractive index layer (D) contains a urethane (meth)acrylate component,
- the fluorine compound in the low refractive index layer (D) has a perfluoropolyether bond, and
- the light absorbing layer (C) is formed from at least one selected from the group consisting of titanium nitride, titanium oxynitride, zirconium nitride, gold, silver, and copper.
6 more elements
Dependencies are inferred from the claim text.