Sensing method and sensing device
AssigneeInnoCare Optoelectronics Corporation
InventorSung-Pao Cheng
Life of this patent
Estimating the term…
Abstract
A sensing method and a sensing device are provided. The sensing method includes the following steps: installing the sensing device on a X-ray source device; obtaining a first distance parameter between a X-ray sensing panel and a distance sensor by the distance sensor of the sensing device; obtaining a second distance parameter between a shooting subject and the distance sensor by the distance sensor of the sensing device; and calculating a thickness parameter of the shooting object according to the first distance parameter and the second distance parameter by a microcontroller unit of the sensing device.
Claims18
A sensing method, comprising:
- installing a sensing device on an X-ray source device;
- obtaining a first distance parameter between an X-ray sensing panel and a distance sensor by the distance sensor of the sensing device;
- obtaining a second distance parameter between a shooting object and the distance sensor by the distance sensor of the sensing device;
- obtaining a tilt angle parameter by an angle sensor of the sensing device;
- correcting the first distance parameter and the second distance parameter by a microcontroller unit of the sensing device according to the tilt angle parameter;
- and
- calculating a thickness parameter of the shooting object according to the corrected first distance parameter and the corrected second distance parameter by the microcontroller unit of the sensing device.
A sensing device, configured to be installed on an X-ray source device, the X-ray source device being configured to irradiate an X-ray sensing panel, and the sensing device comprising:
- a microcontroller unit;
- a distance sensor, coupled to the microcontroller unit and configured to obtain a first distance parameter between the X-ray sensing panel and the distance sensor, and obtain a second distance parameter between a shooting object and the distance sensor;
- and
- an angle sensor, coupled to the microcontroller unit, and configured to obtain a tilt angle parameter,
- wherein the microcontroller unit corrects the first distance parameter and the second distance parameter according to the tilt angle parameter, and calculates a thickness parameter of the shooting object according to the corrected first distance parameter and the corrected second distance parameter.
Dependencies are inferred from the claim text.