Image sensor and imaging device

An imaging device, comprising:

• a semiconductor substrate;
• a plurality of pixels, wherein each pixel of the plurality of pixels includes:
• a photoelectric conversion unit on the semiconductor substrate, wherein the photoelectric conversion unit is configured to photoelectrically convert incident light to an image signal;
• and
• an on-chip lens configured to focus the incident light onto the photoelectric conversion unit;
• a first light-blocking wall configured to block the incident light, wherein
• the first light-blocking wall is adjacent to the semiconductor substrate at a first boundary between the plurality of pixels;
• and
• a second light-blocking wall adjacent to the semiconductor substrate at a second boundary between the plurality of pixels, wherein
• an elevation angle of a first tapered sloped face of the first light-blocking wall from a surface of the semiconductor substrate is greater than 0 in a cross-sectional view,
• θ=(90+φ)/2,
• φ=arctan(h/b),
• b=(w/2)+d,
• in the cross-sectional view, the first tapered sloped face of the first light-blocking wall faces a second tapered sloped face of the first light-blocking wall,
• a vertex of the first light-blocking wall is between the first tapered sloped face and the second tapered sloped face,
• φ is a specific angle between the surface of the semiconductor substrate and a line connecting the vertex and a point where a wall surface of an opposing side of the second light-blocking wall opposing to the first light-blocking wall and the surface of the semiconductor substrate meet,
• h represents a height of the first light-blocking wall,
• w represents a width of the first light-blocking wall,
• d represents a width of a light-receiving surface of a corresponding pixel of the plurality of pixels, and
• the light-receiving surface of the corresponding pixel is the surface of the semiconductor substrate, irradiated by the incident light, between the first light-blocking wall and the second light-blocking wall;
• and
• a processing circuit configured to process the image signal.