Specimen inspection automation system and fixed position information allocation method
AssigneeHitachi High-Tech Corporation
InventorsDaigo Shishido, Kuniaki Onizawa
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AssigneeHitachi High-Tech Corporation
InventorsDaigo Shishido, Kuniaki Onizawa
Estimating the term…
In order to enable easy setting of a configuration of a specimen inspection automation system, the present disclosure proposes a technique for automatically allocating an IP address (unique position information) to each unit constituting the specimen inspection automation system. For example, the present disclosure proposes a specimen inspection automation system comprising: a plurality of slave station devices each of which corresponds to at least one of a transport device for transporting a specimen and an analyzer for analyzing the specimen; and a master station device that communicates with the slave station devices through a communication line and controls the slave station devices. The master station device performs a process for allocating unique position information to each of the slave station devices by using information acquired through communication with the slave station devices.
A specimen test automation system comprising:
A fixed position information allocation method of allocating unique position information to a plurality of slave station devices in a specimen test automation system, the specimen test automation system including the plurality of slave station devices each corresponding to at least one of a transport device that transports a specimen and an analyzer that analyzes the specimen, and a master station device configured to communicate with the plurality of slave station devices via a communication path and control the plurality of slave station devices, wherein
Dependencies are inferred from the claim text.