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US 12,724,255 B2Granted
Angular ptychographic imaging with closed-form reconstruction
AssigneeCalifornia Institute of Technology
InventorsRuizhi Cao, Cheng Shen, Changhuei Yang
Life of this patent
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Abstract
Embodiments pertain to angular ptychographic imaging with closed-form imaging methods, computer products and imaging systems.
Claims17
An imaging method comprising:
- (a) reconstructing a plurality of complex field spectrums from a respective plurality of NA-matching intensity measurements;
- (b) combining the complex field spectrums to determine a reconstructed sample spectrum;
- and
- (c) using a plurality of darkfield intensity measurements to extend the reconstructed sample spectrum to obtain an image with higher resolution than the NA-matching intensity measurements.
1 more element
A computer program product, comprising a non-transitory computer readable medium having computer-executable instructions for performing:
- (a) reconstructing a plurality of complex field spectrums from a respective plurality of NA-matching intensity measurements;
- (b) combining the complex field spectrums to determine a reconstructed sample spectrum;
- and
- (c) using a plurality of darkfield intensity measurements to extend the reconstructed sample spectrum to obtain an image with higher resolution than the NA-matching intensity measurements.
1 more element
An imaging system, comprising:
- an optical system having collection optics;
- an illumination device configured to provide illumination at a plurality of NA-matching illumination angles at a first sequence of image acquisition times and provide illumination at a plurality of darkfield illumination angles at a second sequence of image acquisition times;
- at least one radiation detector configured to receive light from the optical system and acquire a plurality of NA-matching intensity measurements and a plurality of darkfield intensity measurements;
- and
- a computing device configured to:
- (a) reconstruct a plurality of complex field spectrums from the plurality of NA-matching intensity measurements;
- (b) combine the complex field spectrums to determine a reconstructed sample spectrum;
- and
- (c) use the plurality of darkfield intensity measurements to extend the reconstructed sample spectrum to obtain an image with higher resolution than the NA-matching intensity measurements.
6 more elements
Dependencies are inferred from the claim text.