Test and/or measurement system and method for calibrating a test and/or measurement system
AssigneeRohde & Schwarz GmbH & Co. KG
InventorsJulian Harms, Maximilian Friesinger
Life of this patent
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AssigneeRohde & Schwarz GmbH & Co. KG
InventorsJulian Harms, Maximilian Friesinger
Estimating the term…
The application includes a test and/or measurement system having an RF signal source to generate an RF stimulus signal; a device port; a signal path connecting the RF signal source to the device port; a measurement unit coupled to the signal path to measure the RF stimulus signal propagating via the signal path to the device port and a measurement signal received at the device port. A bias tee couples to the signal path and includes a DC input port to receive a DC bias signal. The bias tee couples the DC bias signal into the signal path. The system operates in a calibration mode where at least four different calibration standards are alternately connected to the device port. The system couples the DC bias signal into the signal path during the connection of one or more of the calibration standard(s), but not with all of the calibration standards.
A test and/or measurement system comprising:
A method for calibrating a test and/or measurement system comprising:
A test and/or measurement system comprising:
Dependencies are inferred from the claim text.