Test and/or measurement system and method

A test and/or measurement system, wherein the test and/or measurement system comprises a noise circuit, a first port, a second port, at least one receiver circuit, and at least one processing circuit,

• wherein the noise circuit is configured to generate a noise signal, wherein the noise signal has a frequency spectrum that extends over a predetermined frequency band of interest,
• wherein the noise circuit is connected to the first port, and wherein the first port is connectable to a first DUT port of a device under test such that the noise signal is feedable to the device under test,
• wherein the second port is connectable to a second DUT port of the device under test so as to receive a test signal from the device under test,
• wherein the at least one receiver circuit is connected to the second port so as to receive the test signal,
• wherein the at least one receiver circuit is configured to digitize the test signal, thereby obtaining a digitized test signal,
• wherein the at least one processing circuit is configured to transform the digitized test signal into frequency domain, thereby obtaining a transformed test signal having a plurality of frequency bins, and
• wherein the at least one processing circuit is configured to determine a signal power of the transformed test signal for at least two frequency bins of the plurality of frequency bins simultaneously.