Test and/or measurement instrument and test and/or measurement system

A system for noise measurements, comprising:

• a device under test;
• and
• an instrument for noise measurements of a device under test, wherein the instrument includes
• a signal generator circuit configured to generate a test signal comprising a band-limited noise signal;
• a first port connectable to the device under test;
• a second port connectable to the device under test;
• a first path connected with the first port and the signal generator circuit such that the test signal generated by the signal generator circuit is forwarded to the first port via the first path;
• a second path connected with the second port;
• a measurement circuit that receives a measurement signal from the second path, which corresponds to the test signal being processed by the device under test, wherein the measurement circuit is configured to receive the test signal from the first path or to receive a digital waveform of the test signal, and wherein the measurement circuit is configured to determine a noise contribution of the device under test to the measurement signal based on the test signal received and the measurement signal received from the second path,
• wherein the device under test is connected with the first port and the second port of the instrument, and
• wherein the system further comprises an impedance tuner that is arranged between the first port and the device under test or between the second port and the device under test.

An instrument for noise measurements of a device under test, the instrument comprising:

• a signal generator circuit configured to generate a test signal comprising a band-limited noise signal;
• a first port connectable to the device under test;
• a second port connectable to the device under test;
• a first path connected with the first port and the signal generator circuit such that the test signal generated by the signal generator circuit is forwarded to the first port via the first path;
• a second path connected with the second port;
• a measurement circuit that receives a measurement signal from the second path, which corresponds to the test signal being processed by the device under test, wherein the measurement circuit is coupled with the first path and configured to receive the test signal from the first path, wherein the measurement circuit is configured to determine a noise contribution of the device under test to the measurement signal, and wherein the measurement circuit is configured to determine the noise contribution based on the test signal received from the first path and the measurement signal received from the second path.