Method and system for modeling device under test having multiple antennas

A method of modeling a device under test (DUT) having multiple antennas using a multiple-input multiple-output (MIMO) over-the-air (OTA) test system comprising a base transceiver station (BTS) for sending and receiving radio frequency (RF) test signals to and from the DUT, and a plurality of probes for reproducing a three-dimensional fading environment for the DUT placed in a quiet zone of an anechoic chamber in response to the RF test signals, the method comprising:

• building a plurality of channel impulse response (CIR) files for a plurality of fading channels provided by a channel emulator in the MIMO OTA test system;
• selecting preferred CIR files from the plurality of CIR files;
• and
• performing bi-directional fading emulation with the plurality of fading channels using the preferred CIR files, wherein remaining CIR files of the plurality of CIR files not selected are disregarded;
• and
• reproducing the three-dimensional fading environment for the DUT in the quiet zone by the plurality of probes using the RF test signals adjusted by the bi-directional fading emulation with the plurality of fading channels.

A non-transitory computer readable medium storing instructions for modeling a device under test (DUT) having multiple antennas using a multiple-input multiple-output (MIMO) over-the-air (OTA) test system comprising a base transceiver station (BTS) for sending and receiving radio frequency (RF) test signals to and from the DUT, and a plurality of probes, the instructions, when executed, causing a processing unit to:

• build a plurality of channel impulse response (CIR) files for a plurality of fading channels provided by a channel emulator in the MIMO OTA test system;
• select preferred CIR files from the plurality of CIR files;
• and
• perform bi-directional fading emulation with the plurality of fading channels using the preferred CIR files, wherein remaining CIR files of the plurality of CIR files not selected are disregarded,
• wherein the plurality of probes reproduce a three-dimensional fading environment for the DUT placed in a quiet zone of an anechoic chamber using the RF test signals adjusted by the bi-directional fading emulation with the plurality of fading channels.