Optical analysis device and combined analysis device
AssigneeHORIBA Advanced Techno, Co., Ltd.
InventorsHiroshi Saito, Tatsuya Nakahara
Life of this patent
Estimating the term…
Loading patent…
AssigneeHORIBA Advanced Techno, Co., Ltd.
InventorsHiroshi Saito, Tatsuya Nakahara
Estimating the term…
An optical analysis device that analyzes a sample by irradiating an optical cell containing the sample with light, and detecting light transmitted through the optical cell, the optical analysis device including: a first light source and a second light source each emitting light in a spectrum different from a spectrum of another; an optical element that reflects a part and transmits another part of incident light that has a first face on which the light from the first light source becomes incident and a second face on which the light from the second light source becomes incident; a first light output port provided on a light path of light emitted from the first light source and reflected on the first face, and light emitted from the second light source and transmitted through the second face; and a second light output port provided on a light path of light emitted from the first light source and transmitted through the first face.
An optical analysis device that analyzes a sample by irradiating an optical cell containing the sample with light, and detecting light transmitted through the optical cell, the optical analysis device comprising:
Dependencies are inferred from the claim text.