Spectrometer, distance measuring system, and method for operating a spectrometer
AssigneeMICRO-EPSILON Optronic GmbH
InventorsTobias Otto, Alexander Haussmann, Christoph Grueber
Life of this patent
Estimating the term…
Abstract
A spectrometer with a lens, a dispersive element, and a detector, wherein a measuring light guided onto the lens is projected by way of the lens onto the dispersive element, is reflected back to the lens by the dispersive element in a spectrally dispersed manner, and is guided onto the detector by way of the lens, is designed and developed with regard to high performance given a compact structural size with structurally simple means such that the lens is a single lens or individual lens having at least one non-spherical surface for influencing the imaging. Furthermore, a corresponding distance measurement system and a corresponding method for operating a spectrometer are specified.
Claims14
A spectrometer with an entrance aperture, a lens, a dispersive element, and a detector, wherein the spectrometer has a double pass arrangement in which a measuring light guided onto the lens is projected onto the dispersive element by way of the lens, is reflected back to the lens by the dispersive element in a spectrally dispersed manner, and is guided onto the detector by way of the lens,
- wherein:
- the lens is a single lens or individual lens for influencing an imaging onto the detector,
- the dispersive element has a planar reflection grating located at a distance from the lens,
- the single lens or individual lens comprises two non-spherical surfaces or a free-form surface and an aspherical surface, and
- the entrance aperture for the measuring light is arranged such that the measuring light is obliquely incident on the dispersive element and is reflected approximately perpendicularly from the dispersive element so that an enlargement of an opening in a spectral direction is created that reduces an imaging scale on the detector in the spectral direction.
A method for operating a spectrometer that has an entrance aperture, a lens, a dispersive element, and a detector, wherein the spectrometer has a double pass arrangement, the method comprising:
- guiding a measuring light onto the lens,
- projecting the measuring light onto the dispersive element by way of the lens,
- reflecting the measuring light back to the lens by the dispersive element in a spectrally dispersed manner, and
- guiding the measuring light onto the detector by way of the lens,
- wherein:
- a single lens or individual lens is used as the lens for influencing an imaging onto the detector,
- the dispersive element has a planar reflection grating located at a distance from the lens,
- the single lens or individual lens comprises two non-spherical surfaces or a free-form surface and an aspherical surface, and
- the entrance aperture for the measuring light is arranged such that the measuring light is obliquely incident on the dispersive element and is reflected approximately perpendicularly from the dispersive element so that an enlargement of an opening in a spectral direction is created that reduces an imaging scale on the detector in the spectral direction.
Dependencies are inferred from the claim text.